Skip to content

Navigation Menu

Sign in
Appearance settings

Search code, repositories, users, issues, pull requests...

Provide feedback

We read every piece of feedback, and take your input very seriously.

Saved searches

Use saved searches to filter your results more quickly

Appearance settings

Commit 96cde08

Browse filesBrowse files
committed
[utest][HIL] fix IO test failure
1 parent 72bcb0c commit 96cde08
Copy full SHA for 96cde08

File tree

Expand file treeCollapse file tree

1 file changed

+10
-4
lines changed
Filter options
Expand file treeCollapse file tree

1 file changed

+10
-4
lines changed

‎core/utest/TC_HIL_IO.cpp

Copy file name to clipboardExpand all lines: core/utest/TC_HIL_IO.cpp
+10-4Lines changed: 10 additions & 4 deletions
Original file line numberDiff line numberDiff line change
@@ -15,10 +15,16 @@
1515

1616
static void TC_digital(void)
1717
{
18-
digitalWrite(D3, LOW);
19-
uassert_true(digitalRead(D3) == LOW);
20-
digitalWrite(D3, HIGH);
21-
uassert_true(digitalRead(D3) == HIGH);
18+
pinMode(D13, INPUT);
19+
pinMode(D12, OUTPUT);
20+
21+
digitalWrite(D12, LOW);
22+
rt_thread_delay(5);
23+
uassert_true(digitalRead(D13) == LOW);
24+
25+
digitalWrite(D12, HIGH);
26+
rt_thread_delay(5);
27+
uassert_true(digitalRead(D13) == HIGH);
2228
}
2329

2430
/* Utest function to run all test cases */

0 commit comments

Comments
0 (0)
Morty Proxy This is a proxified and sanitized view of the page, visit original site.